出展の見どころ

SPECK SENSORSYSTEME GmbH
	レーザーEXPO　 No. H-10

〒07745

Germany

URL：http://www.optosensoric.de

● 担当

Development Speck , Uwe

TEL：+493641773520　FAX：

● 出展の見どころ

LID - Measurement of minimal absorptions of optical materials and optical coatings with the highest precision, down to 1 ppm.
CRD - reflectivity measurements for HR mirrors of 99.9998%. Extremely fast measurements in the GHz range of the smallest analog signals with high amplification. Low fluorescent signals also.

● 出展製品

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CRD reflectiviy measurement setup

Cavity-Ringdown measurement systeme for precise evaluation of losses at high-reflective coating of optical components: * Reflectivity is obtained by evalution of losses L with the assumption of R=1-L *Mesurement of losses at plane or slightly concave |r|>>500mm HR-mirror with nominal reflectivities R>>99% (typical 99.9995% * Measurement of losses at various, discret angles of incidence and s- / p-polarization *Employed laser wavelength(s) selectable on order by user according to the desired target wavelength of coating (e.g 355nm to 1310nm)

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LID absolute absorption measurement setup

measurement system for evaluation of ultra low absorption levels in bulk material and coatings: · ultra low absorption levels in bulk material and coatings · Applicable for optical glasses (SiO2, BK7, …), optical crystals (CaF2, YVO4, LiNbO3, …), transparent synthetics (polyacrylates, etc) · Features absolute electrical power calibration, not relying on models or assumptions about the material · Features absolute electrical power calibration, not relying on models or assumptions about the material · determination of the absolute absorption coefficient α ([cm-1] for bulk material) · Sensitivity < 10μW/cm NEP(SiO2) α < 1ppm/cm

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